Mantık - Özel Mantık
- Komponent
- 1,750
- Marka
- 14
Komponentler
1,750 sonuç · Sayfa 19/35| Parça No | Üretici | Part Status | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | Datasheet |
|---|---|---|---|---|---|---|---|---|---|---|
|
SN5480J
ADDER/SUBTRACTOR, TTL |
Rochester Electronics | Active | — | — | — | — | — | — | — | — |
|
SN54H183W
ADDER/SUBTRACTOR, TTL |
Rochester Electronics | Active | — | — | — | — | — | — | — | — |
|
SN54LS181J
IC ARTHMTC UNIT/FUN GEN 24-DIP |
Rochester Electronics | Active | -55°C ~ 125°C | Through Hole | — | 24-CDIP | 4.5V ~ 5.5V | — | Arithmetic Logic Unit | — |
|
SN54S381J
ARITHMETIC LOGIC UNIT |
Rochester Electronics | Active | — | — | — | — | — | — | — | — |
|
SN74283N
ADDER/SUBTRACTOR, 4-BIT, TTL |
Rochester Electronics | Active | — | — | — | — | — | — | — | — |
|
SN7497N
IC SYNC 6BIT BIN RATE MULT 16DIP |
Texas Instruments | Active | 0°C ~ 70°C | Through Hole | — | 16-PDIP | 4.75V ~ 5.25V | 6 | Binary Rate Multiplier | — |
|
SN74ABT18245ADGGR
IC SCAN-TEST-DEV/TXRX 56-TSSOP |
Texas Instruments | Active | -40°C ~ 85°C | Surface Mount | — | 56-TSSOP | 4.5V ~ 5.5V | 18 | Scan Test Device with Bus Transceivers | — |
|
SN74ABT18245ADL
IC SCAN-TEST-DEV/TXRX 56-SSOP |
Texas Instruments | Active | -40°C ~ 85°C | Surface Mount | — | 56-SSOP | 4.5V ~ 5.5V | 18 | Scan Test Device with Bus Transceivers | — |
|
SN74ABT18245ADLR
IC SCAN-TEST-DEV/TXRX 56-SSOP |
Texas Instruments | Active | -40°C ~ 85°C | Surface Mount | — | 56-SSOP | 4.5V ~ 5.5V | 18 | Scan Test Device with Bus Transceivers | — |
|
SN74ABT18502PM
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5V ~ 5.5V | 18 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT18502PMR
IC SCAN TEST DEVICE 18BIT 64LQFP |
Texas Instruments | Active | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5V ~ 5.5V | 18 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT18504PM
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5V ~ 5.5V | 20 | Scan Test Device with Universal Bus Transceivers | — |
|
SN74ABT18504PMR
IC SCAN TEST DEVICE 20BIT 64LQFP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5V ~ 5.5V | 20 | Scan Test Device with Universal Bus Transceivers | — |
|
SN74ABT18504PMRG4
IC SCAN TEST DEVICE 20BIT 64LQFP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5V ~ 5.5V | 20 | Scan Test Device with Universal Bus Transceivers | — |
|
SN74ABT18640DGGR
IC SCAN-TEST-DEV/TXRX 56-TSSOP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 56-TSSOP | 4.5V ~ 5.5V | 18 | Scan Test Device with Inverting Bus Transceivers | — |
|
SN74ABT18640DL
IC SCAN-TEST-DEV/TXRX 56-SSOP |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | — | 56-SSOP | 4.5V ~ 5.5V | 18 | Scan Test Device with Inverting Bus Transceivers | — |
|
SN74ABT18640DLR
IC SCAN TEST DEVICE 18BIT 56SSOP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 56-SSOP | 4.5V ~ 5.5V | 18 | Scan Test Device with Inverting Bus Transceivers | — |
|
SN74ABT18640DLRG4
IC SCAN TEST DEVICE 18BIT 56SSOP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 56-SSOP | 4.5V ~ 5.5V | 18 | Scan Test Device with Inverting Bus Transceivers | — |
|
SN74ABT18646PM
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5V ~ 5.5V | 18 | Scan Test Device With Transceivers And Registers | — |
|
SN74ABT18652PM
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5V ~ 5.5V | 18 | Scan Test Device With Transceivers And Registers | — |
|
SN74ABT8245DW
IC SCAN TEST DEV/TXRX 24-SOIC |
Texas Instruments | Active | -40°C ~ 85°C | Surface Mount | — | 24-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceivers | — |
|
SN74ABT8245DWG4
IC SCAN TEST DEVICE 24SOIC |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | — | 24-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceivers | — |
|
SN74ABT8245DWR
IC SCAN TEST DEV W/OBT 24-SOIC |
Texas Instruments | Active | -40°C ~ 85°C | Surface Mount | — | 24-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceivers | — |
|
SN74ABT8543DL
IC SCAN TEST DEV/TXRX 28-SSOP |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8543DLR
IC SCAN TEST DEVICE 28-SSOP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8543DW
IC SCAN TEST DEV/TXRX 28-SOIC |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8543DWR
IC SCAN TEST DEVICE 28-SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8543DWRE4
IC SCAN TEST DEVICE 28-SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8543DWRG4
IC SCAN TEST DEVICE 28SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8646DL
IC SCAN-TEST-DEV/XCVR 28-SSOP |
Texas Instruments | Active | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8646DLR
IC SCAN TEST DEVICE 28-SSOP |
Texas Instruments | Active | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8646DW
IC SCAN-TEST-DEV/XCVR 28-SOIC |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8646DWR
IC SCAN TEST DEVICE 28-SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8646DWRE4
IC SCAN TEST DEVICE 28-SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8646DWRG4
IC SCAN TEST DEVICE 28SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8652DL
IC SCAN-TEST-DEV/XCVR 28-SSOP |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8652DLR
IC SCAN TEST DEVICE 28-SSOP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8652DLRG4
IC SCAN TEST DEVICE 28-SSOP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8652DW
IC SCAN TEST DEVICE 28-SOIC |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8652DWR
IC SCAN TEST DEVICE 28-SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8652DWRE4
IC SCAN TEST DEVICE 28-SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8652DWRG4
IC SCAN TEST DEVICE 28SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Bus Transceiver and Registers | — |
|
SN74ABT8952DL
IC SCAN-TEST-DEV/XCVR 28-SSOP |
Rochester Electronics | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8952DLR
IC SCAN TESST DEVICE 28-SSOP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8952DLRG4
IC SCAN TESST DEVICE 28-SSOP |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-BSSOP | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8952DW
IC SCAN-TEST-DEV/XCVR 28-SOIC |
Rochester Electronics | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8952DWR
IC SCAN TEST DEVICE 28SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 28-SOIC | 4.5V ~ 5.5V | 8 | Scan Test Device with Registered Bus Transceiver | — |
|
SN74ABT8996DW
IC ADDRESSABLE SCAN PORT 24-SOIC |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | — | 160-NFBGA (9x13) | 4.5V ~ 5.5V | 10 | Addressable Scan Ports | — |
|
SN74ABT8996DWR
IC ADDRESSABLE SCAN PORT 24-SOIC |
Texas Instruments | Obsolete | -40°C ~ 85°C | Surface Mount | — | 24-SOIC | 4.5V ~ 5.5V | 10 | Addressable Scan Ports | — |
|
SN74ABT8996PW
IC ADDRESSABLE SCAN PORT 24TSSOP |
Rochester Electronics | Active | -40°C ~ 85°C | Surface Mount | — | 24-TSSOP | 4.5V ~ 5.5V | 10 | Addressable Scan Ports | — |